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Scanning Probe Microscopy

The Cambridge Centre for Gallium Nitride benefits from the facilities of the Department of Materials Science and Metallurgy’s scanning probe microscopy suite.

The department SPM instrument is a Veeco Dimension 3100 AFM, equipped with a Veeco Nanoscope V controller. Our group has particular strengths with the techniques of atomic force microscopy (AFM), Kelvin probe force microscopy (KPFM), and scanning capacitance microscopy (SCM), as well as having a number of other SPM capabilities.