The Centre benefits from the use of an FEI Helios Nanolab DualBeam FIB/SEM instrument.
The FIB/SEM is used to prepare samples for transmission electron microscopy and for atom probe tomography, and is also useful for micromachining and deposition.
Cambridge Centre for Gallium Nitride
The Centre benefits from the use of an FEI Helios Nanolab DualBeam FIB/SEM instrument.
The FIB/SEM is used to prepare samples for transmission electron microscopy and for atom probe tomography, and is also useful for micromachining and deposition.
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