We aim to deliver on our first goal by offering a variety of different approaches for measuring at the system. We offer help to other people to fullfill their projects by providing service measurements, cooperative measurements as well as all the training needed for operating the instrument and analysing the acquired data. We are specifically interested in facilitating the analysis of carrier dynamics on the nanoscale (i.e. at grain boundaries or close to dislocations), low temperature measurements and beam sensitive samples.
Fig.: Streak image of the time decay in a deep-UV LED