skip to primary navigationskip to content
 

Congratulations Dr O'Hanlon

last modified Dec 11, 2018 04:51 PM

Congratulations to Tom O'Hanlon who successfully defended his PhD thesis today. His work explored multiple microscopy of nitride structures. Well done Tom!

We conduct world leading research into nitride based III-V semiconductors: material quality, characterisation and device development.

We are passionate about education and outreach! If you would like support for an education project then please .

January 2019: Characterisation of InGaN by Photoconductive Atomic Force Microscopy

Read more